atomic force microscopy2022-09-22T10:05:08+01:00

Atomic Force Microscopy

What is atomic force microscopy?

Atomic Force Microscopy (AFM) is the most powerful microscopic technique, which offers three-dimensional images of the scanned material with exceptional detail and resolutions.  Unlike the other microscopy techniques AFM does not use light or electrons to see the surface, it “feels” it instead with a very fine and sharp cantilever and a mounted tip.  The tip is scanning the surface in two directions and gives the profile of the scanned surface in sub-nanometer detail.

In the plastics industry, AFM is often used to investigate the phase separation between the polymer blends within the material, the dispersion of additives, particles, the crystallisation rate, the friction properties, the surface roughness etc.

Impact Laboratories collaborate with Prof. Vasileios Koutsos group at the University of Edinburgh in order to use this technique for several internal and external polymer development projects.

 

atomic force microscopy

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Les Rose

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